Innovative Layout Optimization Methodology & Via Routing Pattern to Enable UCIe-36Gbps in Organic Interposer

Event Time

Originally Aired - Thursday, January 30 8:00 AM - 8:45 AM Pacific Time (US & Canada)

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Event Location

Location: Ballroom C


Event Information

Title: Innovative Layout Optimization Methodology & Via Routing Pattern to Enable UCIe-36Gbps in Organic Interposer

Session Handouts Available Upon Speaker Approval: 1

Description:

Universal-Chiplet-Interconnect-Express (UCIe) is enabling multi-die systems poised to dominate high-performance data center AI semiconductors. With market demands pushing for UCIe-36Gbps, semiconductor foundries are enhancing 2.5D/3D packaging solutions to address layout and SI-PI challenges associated with high-bandwidth multi-die systems. Feasibility analysis shows CoWoS-S technology can be used for UCIe-36Gbps without major issues. However, CoWoS-R is an excellent choice for larger SoC where it has demonstrated excellent reliability [10]. 

This paper presents a novel SI-PI methodology and layout optimization techniques to minimize crosstalk and achieve 36Gbps in UCIe xA64 die-to-die connections using CoWoS-R technology. Our methodology combines 2D and 3D-EM extraction, balancing accuracy, and time. 

We highlight the challenges of implementing a Ground-Signal-Ground (G-S-G) routing pattern within the 45µm diagonal pitch micro bump pin field of a UCIe-x64 module due to CoWoS-R constraints, such as large via enclosures and stringent trace width and spacing requirements. These constraints lead to high crosstalk and obstruct UCIe-xA64 signal fanout within the 388.8µm shoreline width. 

This paper explains how we overcome these challenges with a novel via fanout and routing pattern (patent-pending) that facilitates G-S-G routing within the micro bump field, decreases crosstalk, and ensures successful signal fanout at 36Gbps within the specified shoreline width.

Type: Technical Paper Session


Categories

Primary Track

  • 05. Advanced Interface Design for Memory/HBM, Chiplet, Multi-die & 3DIC/SiP Integrations

Secondary Track

  • 01. Signal & Power Integrity for Single-Multi Die, Interposer & Packaging

Education Level

  • Advanced

Discipline

  • Signal Integrity

Pass Type

  • All Access Conference Pass
  • 2 Day Conference Pass (W-Th)
  • Education Pass
  • Author
  • Media
  • Speaker

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